Invention Grant
- Patent Title: Charge loss detection using a multiple sampling scheme
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Application No.: US17666955Application Date: 2022-02-08
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Publication No.: US11862255B2Publication Date: 2024-01-02
- Inventor: Jun Xu , Theodore T. Pekny
- Applicant: Micron Technology, Inc.
- Applicant Address: US ID Boise
- Assignee: Micron Technology, Inc.
- Current Assignee: Micron Technology, Inc.
- Current Assignee Address: US ID Boise
- Agency: Lowenstein Sandler LLP
- Main IPC: G11C16/34
- IPC: G11C16/34

Abstract:
A memory device includes a memory array and control logic, operatively coupled with the memory array, to perform operations including causing a first current to be obtained with respect to cells of a wordline maintained at a first voltage, determining that the cells are at a second voltage lower than the first voltage, in response to determining that the cells are the second voltage, causing a voltage ramp down process to be initiated, causing a second current to be sampled with respect to the cells during the voltage ramp down process, and detecting an existence of charge loss by determining whether the second current satisfies a threshold condition in view of the first current.
Public/Granted literature
- US20230017995A1 CHARGE LOSS DETECTION USING A MULTIPLE SAMPLING SCHEME Public/Granted day:2023-01-19
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