Invention Grant
- Patent Title: Method of forming transition metal dichalcogenide thin film
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Application No.: US18063909Application Date: 2022-12-09
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Publication No.: US11869768B2Publication Date: 2024-01-09
- Inventor: Changhyun Kim , Sang-Woo Kim , Kyung-Eun Byun , Hyeonjin Shin , Ahrum Sohn , Jaehwan Jung
- Applicant: Samsung Electronics Co., Ltd. , RESEARCH & BUSINESS FOUNDATION SUNGKYUNKWAN UNIVERSITY
- Applicant Address: KR Suwon-si
- Assignee: Samsung Electronics Co., Ltd.
- Current Assignee: Samsung Electronics Co., Ltd.
- Current Assignee Address: KR Gyeonggi-do
- Agency: Harness, Dickey & Pierce, P.L.C.
- Priority: KR 20190095165 2019.08.05
- Main IPC: H01L21/00
- IPC: H01L21/00 ; H01L21/02

Abstract:
Disclosed herein are a method of forming a transition metal dichalcogenide thin film and a method of manufacturing a device including the same. The method of forming a transition metal dichalcogenide thin film includes: providing a substrate in a reaction chamber; depositing a transition metal dichalcogenide thin film on the substrate using a sputtering process that uses a transition metal precursor and a chalcogen precursor and is performed at a first temperature; and injecting the chalcogen precursor in a gas state and heat-treating the transition metal dichalcogenide thin film at a second temperature that is higher than the first temperature. The substrate may include a sapphire substrate, a silicon oxide (SiO2) substrate, a nanocrystalline graphene substrate, or a molybdenum disulfide (MoS2) substrate.
Public/Granted literature
- US20230114347A1 METHOD OF FORMING TRANSITION METAL DICHALCOGENIDE THIN FILM Public/Granted day:2023-04-13
Information query
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