Invention Grant
- Patent Title: Contact probe and probe unit
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Application No.: US17729135Application Date: 2022-04-26
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Publication No.: US11874300B2Publication Date: 2024-01-16
- Inventor: Kazuya Souma , Tsukasa Sakaguchi
- Applicant: NHK Spring Co., Ltd.
- Applicant Address: JP Yokohama
- Assignee: NHK SPRING CO., LTD.
- Current Assignee: NHK SPRING CO., LTD.
- Current Assignee Address: JP Kanagawa
- Agency: Locke Lord LLP
- Priority: JP 17069272 2017.03.30
- Main IPC: G01R1/067
- IPC: G01R1/067

Abstract:
A contact probe includes: a first contact member; a second contact member; and a spring member. The first contact member includes: a first tip part configured to contact a first contact target; and a boss part configured to couple with the spring member by fitting into the spring member, and the second contact member includes: a second tip part configured to contact a second contact target; and a cylindrical part extending from the second tip part and having a cylindrical shape with an inner circumference having a uniform diameter, the cylindrical part being engaged with at least a portion of the spring member, the portion of the spring member that is engaged with the cylindrical part having a diameter larger than the other portion of the spring member, the entire spring member being configured to be housed in the cylindrical part when the spring member is contracted.
Public/Granted literature
- US20220252640A1 CONTACT PROBE AND PROBE UNIT Public/Granted day:2022-08-11
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