- Patent Title: Temperature-based scrambling for error control in memory systems
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Application No.: US17456980Application Date: 2021-11-30
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Publication No.: US11875039B2Publication Date: 2024-01-16
- Inventor: Christopher Joseph Bueb
- Applicant: Micron Technology, Inc.
- Applicant Address: US ID Boise
- Assignee: Micron Technology, Inc.
- Current Assignee: Micron Technology, Inc.
- Current Assignee Address: US ID Boise
- Agency: Holland & Hart LLP
- Main IPC: G06F3/06
- IPC: G06F3/06

Abstract:
Methods, systems, and devices for temperature-based scrambling for error control in memory systems are described. Techniques are described for a memory system to scramble data using different scrambling code parameters when writing the data at different temperatures. Scrambling the data using scrambling code parameters that are based on the temperatures at the time or writing the data may reduce errors introduced into the data by operating the memory cells at extreme temperatures.
Public/Granted literature
- US20230168813A1 TEMPERATURE-BASED SCRAMBLING FOR ERROR CONTROL IN MEMORY SYSTEMS Public/Granted day:2023-06-01
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