• Patent Title: Device for measuring two-dimensional flicker
  • Application No.: US17276791
    Application Date: 2019-07-19
  • Publication No.: US11892350B2
    Publication Date: 2024-02-06
  • Inventor: Satoshi Masuda
  • Applicant: KONICA MINOLTA, INC.
  • Applicant Address: JP Chiyoda-ku
  • Assignee: KONICA MINOLTA, INC.
  • Current Assignee: KONICA MINOLTA, INC.
  • Current Assignee Address: JP Tokyo
  • Agency: Cozen O'Connor
  • Priority: JP 18173419 2018.09.18
  • International Application: PCT/JP2019/028447 2019.07.19
  • International Announcement: WO2020/059282A 2020.03.26
  • Date entered country: 2021-03-16
  • Main IPC: G01J11/00
  • IPC: G01J11/00 G01J1/44
Device for measuring two-dimensional flicker
Abstract:
A device for measuring two-dimensional flicker of the present application includes a plurality of two-dimensional sensors having a partial readout function of reading out only a pixel value of some of photoelectric conversion elements included in set partial readout regions, among a plurality of photoelectric conversion elements. In the device for measuring two-dimensional flicker, a plurality of measurement regions are set two-dimensionally on a measurement target object. Each pixel in the plurality of measurement regions is individually acquired, by setting each of the plurality of partial readout regions of the plurality of two-dimensional sensors in each of a plurality of partial imaging regions obtained by dividing an entire imaging region including entirely the measurement target object. A flicker value of the plurality of measurement regions is individually obtained based on each pixel value in the plurality of measurement regions.
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