Invention Grant
- Patent Title: Device for measuring two-dimensional flicker
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Application No.: US17276791Application Date: 2019-07-19
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Publication No.: US11892350B2Publication Date: 2024-02-06
- Inventor: Satoshi Masuda
- Applicant: KONICA MINOLTA, INC.
- Applicant Address: JP Chiyoda-ku
- Assignee: KONICA MINOLTA, INC.
- Current Assignee: KONICA MINOLTA, INC.
- Current Assignee Address: JP Tokyo
- Agency: Cozen O'Connor
- Priority: JP 18173419 2018.09.18
- International Application: PCT/JP2019/028447 2019.07.19
- International Announcement: WO2020/059282A 2020.03.26
- Date entered country: 2021-03-16
- Main IPC: G01J11/00
- IPC: G01J11/00 ; G01J1/44

Abstract:
A device for measuring two-dimensional flicker of the present application includes a plurality of two-dimensional sensors having a partial readout function of reading out only a pixel value of some of photoelectric conversion elements included in set partial readout regions, among a plurality of photoelectric conversion elements. In the device for measuring two-dimensional flicker, a plurality of measurement regions are set two-dimensionally on a measurement target object. Each pixel in the plurality of measurement regions is individually acquired, by setting each of the plurality of partial readout regions of the plurality of two-dimensional sensors in each of a plurality of partial imaging regions obtained by dividing an entire imaging region including entirely the measurement target object. A flicker value of the plurality of measurement regions is individually obtained based on each pixel value in the plurality of measurement regions.
Public/Granted literature
- US20210356327A1 Device for Measuring Two-Dimensional Flicker Public/Granted day:2021-11-18
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