Invention Grant
- Patent Title: Calibration device and calibration method
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Application No.: US17528582Application Date: 2021-11-17
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Publication No.: US11900669B2Publication Date: 2024-02-13
- Inventor: Keiichi Mitani , Kazuyuki Tajima , Kazuyoshi Yamazaki
- Applicant: HITACHI, LTD.
- Applicant Address: JP Tokyo
- Assignee: HITACHI, LTD.
- Current Assignee: HITACHI, LTD.
- Current Assignee Address: JP Tokyo
- Agency: Volpe Koenig
- Priority: JP 20201534 2020.12.04
- Main IPC: G06V20/00
- IPC: G06V20/00 ; G06V20/13 ; G06V20/54 ; G06V10/147 ; G06V10/22 ; G06F18/22 ; G06F18/00 ; G06F18/231

Abstract:
A calibration device performs a calibration between a plurality of imaging devices, each of which outputs field-of-view information which is information on a field-of-view of the imaging device itself. The field-of-view information contains a bitmap image and a range image. The calibration device includes: a state estimation part configured to detect, in a field of view of a first imaging device, an image of a second imaging device, and estimate a relative position and a relative attitude of the second imaging device with respect to the first imaging device, based on the detected image; and a transformation information calculation part configured to calculate transformation information between a coordinate system of the first imaging device and a coordinate system of the second imaging device, based on the estimated relative position and relative attitude.
Public/Granted literature
- US20220180086A1 CALIBRATION DEVICE AND CALIBRATION METHOD Public/Granted day:2022-06-09
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