发明授权
- 专利标题: Three-dimensional shape measuring method and three-dimensional shape measuring device
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申请号: US17475387申请日: 2021-09-15
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公开(公告)号: US11906288B2公开(公告)日: 2024-02-20
- 发明人: Shuji Narimatsu , Hirosada Horiguchi , Hiroshi Hasegawa
- 申请人: Seiko Epson Corporation
- 申请人地址: JP Tokyo
- 专利权人: SEIKO EPSON CORPORATION
- 当前专利权人: SEIKO EPSON CORPORATION
- 当前专利权人地址: JP
- 代理机构: Harness, Dickey & Pierce, P.L.C.
- 优先权: JP 20155381 2020.09.16
- 主分类号: G01B11/06
- IPC分类号: G01B11/06 ; G01B11/25 ; G06T7/521 ; G06T7/60 ; G06T7/73
摘要:
A three-dimensional shape measuring method includes: projecting a first grid pattern based on a first light and a first full pattern based on a second light onto a target object, the first light and the second light being lights of two colors included in three primary colors of light; picking up, by a three-color camera, an image of the first grid pattern and the first full pattern projected on the target object, and acquiring a first picked-up image based on the first light and a second picked-up image based on the second light; and calculating height information of the target object, using the first picked-up image, and calculating position information of the target object, using the second picked-up image.
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