- 专利标题: Processes, apparatuses and system for measuring a measured variable
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申请号: US17771308申请日: 2020-10-19
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公开(公告)号: US11921070B2公开(公告)日: 2024-03-05
- 发明人: Nils Trautmann , Ulrich Vogl , Jörg Wrachtrup , Rainer Stöhr
- 申请人: Carl Zeiss AG
- 申请人地址: DE Oberkochen
- 专利权人: Carl Zeiss AG
- 当前专利权人: Carl Zeiss AG
- 当前专利权人地址: DE Oberkochen
- 代理机构: KUSNER & JAFFE
- 优先权: DE 2019128932.7 2019.10.25
- 国际申请: PCT/EP2020/079366 2020.10.19
- 国际公布: WO2021/078684A 2021.04.29
- 进入国家日期: 2022-04-22
- 主分类号: G01V3/00
- IPC分类号: G01V3/00 ; G01N21/64 ; G01N24/10 ; G01R33/00 ; G01R33/26 ; G01R33/60
摘要:
It is an object of the invention to improve processes, apparatuses and systems for measuring a measured variable. To this end, a measured variable is measured in a measuring process on the basis of an NV center as a quantum sensor. The NV center has a plurality of quantum states and is optically excitable on the basis of an occupancy of one of the quantum states into at least one excited state of the quantum states by means of an excitation light. The at least one excited state can decay at least with emission of emission light of the NV center. In the measuring process, the NV center is irradiated by the excitation light, the excitation light having a time periodic modulation, and a respective occupancy probability and/or a respective lifetime of the quantum states depending on the measured variable and the excitation light. A phase shift is determined between the emission light of the NV center and the modulation of the excitation light and a measurement value for the measured variable is determined on the basis thereof.
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