- 专利标题: System and method for offset calibration in a successive approximation analog to digital converter
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申请号: US17694225申请日: 2022-03-14
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公开(公告)号: US11929756B2公开(公告)日: 2024-03-12
- 发明人: Yong Liu , Jun Cao , Delong Cui
- 申请人: AVAGO TECHNOLOGIES INTERNATIONAL SALES PTE. LIMITED
- 申请人地址: SG Singapore
- 专利权人: Avago Technologies International Sales Pte. Limited
- 当前专利权人: Avago Technologies International Sales Pte. Limited
- 当前专利权人地址: SG Singapore
- 代理机构: Foley & Lardner LLP
- 主分类号: H03M1/10
- IPC分类号: H03M1/10 ; H03M1/12 ; H03M1/46
摘要:
Disclosed herein are related to systems and methods for a successive approximation analog to digital converter (SAR ADC). In one aspect, the SAR ADC includes a calibration circuit configured to receive some or all of the plurality of bits corresponding to the input voltage and accumulates or averages at least some of the bits corresponding to the input voltage. The calibration circuit is configured to provide a first offset signal to control a first offset associated with a first comparator, a second offset signal to control a second offset associated with a second comparator, or reduce an offset difference associated with the first offset and the second offset.
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