Invention Grant
- Patent Title: Linear structure extraction device, method, program, and learned model
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Application No.: US17477547Application Date: 2021-09-17
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Publication No.: US11961276B2Publication Date: 2024-04-16
- Inventor: Yoshiro Kitamura , Akimichi Ichinose
- Applicant: FUJIFILM Corporation
- Applicant Address: JP Tokyo
- Assignee: FUJIFILM Corporation
- Current Assignee: FUJIFILM Corporation
- Current Assignee Address: JP Tokyo
- Agency: JCIPRNET
- Priority: JP 19066982 2019.03.29
- Main IPC: G06V10/44
- IPC: G06V10/44 ; A61B6/50 ; G06F18/213 ; G06F18/214 ; G06F18/2431 ; G06T3/4046 ; G06T7/00 ; G06V10/25 ; G06V10/94

Abstract:
Provided are a linear structure extraction device, a method, a program, and a learned model which can detect a linear structure in an image. A linear structure extraction device according to an embodiment of the present disclosure includes a learning model that is learned to receive an input of the image and output, as a prediction result, one or more element points which constitute the linear structure from the image, in which the learning model includes a first processing module that receives the image and generates a feature map representing a feature amount of the image by convolution processing, and a second processing module that calculates a shift amount from a unit center point to the element point of the linear structure closest to the unit center point, for each unit obtained by dividing the feature map into a plurality of the units including regions having a predetermined size in a grid pattern.
Public/Granted literature
- US20220004797A1 LINEAR STRUCTURE EXTRACTION DEVICE, METHOD, PROGRAM, AND LEARNED MODEL Public/Granted day:2022-01-06
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