• 专利标题: Level meter and method of setting the level meter
  • 申请号: US17642921
    申请日: 2020-10-29
  • 公开(公告)号: US11971288B2
    公开(公告)日: 2024-04-30
  • 发明人: Hiroki Tanaka
  • 申请人: PATLITE CORPORATION
  • 申请人地址: JP Osaka
  • 专利权人: PATLITE CORPORATION
  • 当前专利权人: PATLITE CORPORATION
  • 当前专利权人地址: JP Osaka
  • 代理机构: Rabin & Berdo, P.C.
  • 国际申请: PCT/JP2020/040617 2020.10.29
  • 国际公布: WO2022/091292A 2022.05.05
  • 进入国家日期: 2022-03-14
  • 主分类号: G01F23/00
  • IPC分类号: G01F23/00
Level meter and method of setting the level meter
摘要:
A level meter includes light emission segments forming an emission region, a register portion to register a default emission condition and an emission-condition specified value, and a control portion. The control portion controls the light emission so that the emission region spreads in an emission proceeding direction according to an increase in numerical quantity to be expressed. An emission-condition specified value indicates a command to apply a predetermined specified emission condition concerning a subsequent segment positioned on a more upstream side than a foremost segment positioned on a most downstream side in the emission proceeding direction. The control portion allows all the light emission segments forming the emission region to emit light based on the default emission condition, and the control portion allows the foremost segment to emit light based on the default emission condition whereas allowing the subsequent segment to emit light based on the specified emission condition.
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