- Patent Title: Method for measuring distance to a short in a two-conductor wire
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Application No.: US17451150Application Date: 2021-10-15
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Publication No.: US11971441B2Publication Date: 2024-04-30
- Inventor: Paul Dominic Hiscock , Murray Jarvis , Nicolas Graube , Mafalda Pereira Varela , Thomas Allan
- Applicant: QUALCOMM Incorporated
- Applicant Address: US CA San Diego
- Assignee: QUALCOMM Incorporated
- Current Assignee: QUALCOMM Incorporated
- Current Assignee Address: US CA San Diego
- Agency: The Marbury Law Group, PLLC
- Main IPC: G01R31/08
- IPC: G01R31/08 ; G01R19/165 ; G01S13/88

Abstract:
Various embodiments may provide systems and methods for determining a distance to a short in a two-conductor wire. Various embodiments may include determining a distance to a short in a two-conductor wire based at least in part on a phase difference between a phase of an injected tone and a phase of a reflected tone. Various embodiments may include determining a distance to a short in a two-conductor wire based at least in part on both a phase difference and an amplitude difference between an injected tone and a reflected tone. Various embodiments may include determining a distance to a short in a two-conductor wire based at least in part on a measured peak voltage of a combined pulse.
Public/Granted literature
- US20230118013A1 Method for Measuring Distance To A Short In A Two-Conductor Wire Public/Granted day:2023-04-20
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