- 专利标题: Data test method, electronic device and storage medium
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申请号: US17333472申请日: 2021-05-28
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公开(公告)号: US11971959B2公开(公告)日: 2024-04-30
- 发明人: Cheng-Feng Wang
- 申请人: HON HAI PRECISION INDUSTRY CO., LTD.
- 申请人地址: TW New Taipei
- 专利权人: HON HAI PRECISION INDUSTRY CO., LTD.
- 当前专利权人: HON HAI PRECISION INDUSTRY CO., LTD.
- 当前专利权人地址: TW New Taipei
- 代理机构: ScienBiziP, P.C.
- 优先权: CN 2010515895.8 2020.06.09
- 主分类号: G06F11/30
- IPC分类号: G06F11/30 ; G06F18/23 ; G06F18/23211 ; G06F18/2413
摘要:
A data test method, an electronic device, and a storage medium are provided. In the data test method, based on a Density-Based Spatial Clustering of Applications with Noise (DBSCAN), at least one cluster is obtained by removing discrete points in the target data and performing clustering, an calculation result is obtained by performing a regression analysis on the target data with the objective function, and parameters to be tested are verified according to the calculation result. Utilizing the data test method, objective function can be used to perform verification and residual analysis on the target data, related descriptions are be repeated here.
公开/授权文献
- US20210383162A1 DATA TEST METHOD, ELECTRONIC DEVICE AND STORAGE MEDIUM 公开/授权日:2021-12-09
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