Invention Grant
- Patent Title: Concentration measurement device
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Application No.: US17434963Application Date: 2020-03-17
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Publication No.: US11994481B2Publication Date: 2024-05-28
- Inventor: Susumu Kamiyama , Hajime Kano , Shinya Nakagawa , Hideyuki Nakao , Kenichi Handa , Takashi Kasai
- Applicant: OMRON Corporation
- Applicant Address: JP Kyoto
- Assignee: OMRON CORPORATION
- Current Assignee: OMRON CORPORATION
- Current Assignee Address: JP Kyoto
- Agency: ROSSI, KIMMS & McDOWELL LLP
- Priority: JP 19051263 2019.03.19
- International Application: PCT/JP2020/011702 2020.03.17
- International Announcement: WO2020/189677A 2020.09.24
- Date entered country: 2021-08-30
- Main IPC: G01N25/18
- IPC: G01N25/18 ; G01N27/18

Abstract:
It is possible to reduce a decrease in accuracy of measuring the concentration of a measurement target gas even in a case where, in a mixture of gases, there is a gas greatly different from another gas in a rate of change in thermal conductivity with respect to temperature. The concentration measurement device includes a sensor configured to measure the concentration of a measurement target gas in a mixture of gases on the basis of thermal conductivity of the measurement target gas, the mixture of gases including two or more components, and a heating unit configured to heat the mixture of gases so that the concentration of the measurement target gas can be uniquely determined with respect to the thermal conductivity.
Public/Granted literature
- US20220136988A1 CONCENTRATION MEASUREMENT DEVICE Public/Granted day:2022-05-05
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