Invention Grant
- Patent Title: Driving device provided with piezoelectric element deterioration detection circuit and deterioration detection method
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Application No.: US17604982Application Date: 2020-04-20
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Publication No.: US11994482B2Publication Date: 2024-05-28
- Inventor: Atsushi Hidaka , Katsuyuki Sugita , Takatoshi Nakatani , Kouji Nishino , Nobukazu Ikeda
- Applicant: FUJIKIN INCORPORATED
- Applicant Address: JP Osaka
- Assignee: FUJIKIN INCORPORATED
- Current Assignee: FUJIKIN INCORPORATED
- Current Assignee Address: JP Osaka
- Agency: Studebaker & Brackett PC
- Priority: JP 19084548 2019.04.25
- International Application: PCT/JP2020/016998 2020.04.20
- International Announcement: WO2020/218226A 2020.10.29
- Date entered country: 2022-04-06
- Main IPC: B06B1/06
- IPC: B06B1/06 ; F16K37/00 ; G01N27/02

Abstract:
The driving device includes a piezoelectric element, a power supply unit, a first resistor, a second resistor, a measuring unit and a control unit, wherein resistance values of the first resistor and the second resistor are smaller than an insulating resistance value of the piezoelectric element, the measuring unit measures, a voltage across the first resistor (voltage between a first terminal and a second terminal), in a state of supplying a predetermined voltage from the power supply unit, and the control unit calculates a resistance value of the piezoelectric element from a voltage value obtained by the measurement of the measuring unit, and determines, whether or not degradation has occurred in the piezoelectric element based on the calculated resistance value.
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Information query
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