Invention Grant
- Patent Title: Testing device
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Application No.: US17622842Application Date: 2021-12-22
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Publication No.: US11994497B2Publication Date: 2024-05-28
- Inventor: Yichun Huang
- Applicant: HUIZHOU CHINA STAR OPTOELECTRONICS DISPLAY CO., LTD.
- Applicant Address: CN Guangdong
- Assignee: HUIZHOU CHINA STAR OPTOELECTRONICS DISPLAY CO., LTD.
- Current Assignee: HUIZHOU CHINA STAR OPTOELECTRONICS DISPLAY CO., LTD.
- Current Assignee Address: CN Guangdong
- Agency: PV IP PC
- Agent Wei Te Chung; Zhigang Ma
- Priority: CN 2111526434.1 2021.12.14
- International Application: PCT/CN2021/140616 2021.12.22
- International Announcement: WO2023/108774A 2023.06.22
- Date entered country: 2021-12-26
- Main IPC: G01N3/04
- IPC: G01N3/04 ; G01N3/20

Abstract:
The present application provides a testing device. The testing device includes: a box, a pressing mechanism, a sliding mechanism, a transmission mechanism, and first clamping mechanisms. The pressing mechanism is located inside the box. A gap between the pressing mechanism and the first side of the box is used to place substrates to be tested. The pressing mechanism is slidably connected to the sliding mechanism. The transmission mechanism is connected to the pressing mechanism to drive the pressing mechanism to move. Each first clamping mechanism is used to hold one of the substrates to be tested.
Public/Granted literature
- US20240035940A1 TESTING DEVICE Public/Granted day:2024-02-01
Information query