发明授权
- 专利标题: Testing device
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申请号: US17622842申请日: 2021-12-22
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公开(公告)号: US11994497B2公开(公告)日: 2024-05-28
- 发明人: Yichun Huang
- 申请人: HUIZHOU CHINA STAR OPTOELECTRONICS DISPLAY CO., LTD.
- 申请人地址: CN Guangdong
- 专利权人: HUIZHOU CHINA STAR OPTOELECTRONICS DISPLAY CO., LTD.
- 当前专利权人: HUIZHOU CHINA STAR OPTOELECTRONICS DISPLAY CO., LTD.
- 当前专利权人地址: CN Guangdong
- 代理机构: PV IP PC
- 代理商 Wei Te Chung; Zhigang Ma
- 优先权: CN 2111526434.1 2021.12.14
- 国际申请: PCT/CN2021/140616 2021.12.22
- 国际公布: WO2023/108774A 2023.06.22
- 进入国家日期: 2021-12-26
- 主分类号: G01N3/04
- IPC分类号: G01N3/04 ; G01N3/20
摘要:
The present application provides a testing device. The testing device includes: a box, a pressing mechanism, a sliding mechanism, a transmission mechanism, and first clamping mechanisms. The pressing mechanism is located inside the box. A gap between the pressing mechanism and the first side of the box is used to place substrates to be tested. The pressing mechanism is slidably connected to the sliding mechanism. The transmission mechanism is connected to the pressing mechanism to drive the pressing mechanism to move. Each first clamping mechanism is used to hold one of the substrates to be tested.
公开/授权文献
- US20240035940A1 TESTING DEVICE 公开/授权日:2024-02-01
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