Invention Grant
- Patent Title: Scan fragmentation in memory devices
-
Application No.: US17824562Application Date: 2022-05-25
-
Publication No.: US11995320B2Publication Date: 2024-05-28
- Inventor: Vamsi Pavan Rayaprolu , Christopher M. Smitchger , Saeed Sharifi Tehrani
- Applicant: Micron Technology, Inc.
- Applicant Address: US ID Boise
- Assignee: Micron Technology, Inc.
- Current Assignee: Micron Technology, Inc.
- Current Assignee Address: US ID Boise
- Agency: Lowenstein Sandler LLP
- Main IPC: G06F3/06
- IPC: G06F3/06

Abstract:
A memory system includes a memory device and a processing device, operatively coupled to the memory device. The processing device performs operations comprising: identifying one or more mandatory scan wordlines of the memory device and one or more remaining wordlines of the memory device; performing a plurality of scan iterations with respect to a plurality of pages of the memory device, such that performing each scan iteration comprises: identifying, among the remaining wordlines, one or more scheduled scan wordlines of the memory device, scanning a subset of pages of the memory device that are addressable by the mandatory scan wordlines and the scheduled scan wordlines; wherein a combination of a first plurality of pages addressable by the scheduled scan wordlines selected by the plurality of scan iterations and a second plurality of pages addressable by the mandatory wordlines comprises the plurality of pages of the memory device.
Public/Granted literature
- US20220391102A1 SCAN FRAGMENTATION IN MEMORY DEVICES Public/Granted day:2022-12-08
Information query