- 专利标题: High impedance fault detection and location accuracy
-
申请号: US17337976申请日: 2021-06-03
-
公开(公告)号: US12013427B2公开(公告)日: 2024-06-18
- 发明人: Qiushi Cui , Yang Weng
- 申请人: Qiushi Cui , Yang Weng
- 申请人地址: US AZ Tempe
- 专利权人: Arizona Board of Regents on behalf of Arizona State University
- 当前专利权人: Arizona Board of Regents on behalf of Arizona State University
- 当前专利权人地址: US AZ Scottsdale
- 代理机构: Lewis Roca Rothgerber Christie LLP
- 主分类号: G01R27/16
- IPC分类号: G01R27/16 ; G01R23/16 ; G01R31/08
摘要:
High impedance fault (HIF) detection and location accuracy is provided. An HIF has random, irregular, and unsymmetrical characteristics, making such a fault difficult to detect in distribution grids via conventional relay measurements with relatively low resolution and accuracy. Embodiments disclosed herein provide a stochastic HIF monitoring and location scheme using high-resolution time-synchronized data in micro phasor measurement units (μ-PMUs) for distribution network protection. In particular, a fault detection and location process is systematically designed based on feature selections, semi-supervised learning (SSL), and probabilistic learning.
公开/授权文献
- US20210396799A1 HIGH IMPEDANCE FAULT DETECTION AND LOCATION ACCURACY 公开/授权日:2021-12-23
信息查询