- 专利标题： Method and device for evaluating quality of pathological slide image
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申请号： US18321132申请日： 2023-05-22
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公开(公告)号： US12014502B2公开(公告)日： 2024-06-18
- 发明人: Ga Hee Park , Kyung Hyun Paeng , Chan Young Ock , Sang Hoon Song , Suk Jun Kim
- 申请人： Lunit Inc.
- 申请人地址： KR Seoul
- 专利权人： Lunit Inc.
- 当前专利权人： Lunit Inc.
- 当前专利权人地址： KR Seoul
- 代理机构： Sughrue Mion, PLLC
- 优先权： KR 20220063320 2022.05.24 KR 20230038276 2023.03.23
- 主分类号： G06K9/00
- IPC分类号： G06K9/00 ; G06T7/00 ; G06V20/69 ; G16H15/00 ; G16H30/40
摘要：
A computing device includes at least one memory, and at least one processor configured to analyze at least one object expressed in a pathological slide image, evaluate quality of the pathological slide image based on a result of the analyzing, and perform at least one additional operation according to a result of the evaluating.
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