- 专利标题: Measuring loop resistance
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申请号: US17812394申请日: 2022-07-13
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公开(公告)号: US12019107B2公开(公告)日: 2024-06-25
- 发明人: Stanislaw Zurek , Jeffrey Jones , Freddie Chin
- 申请人: Megger Instruments Ltd
- 申请人地址: GB Dover
- 专利权人: Megger Instruments Ltd
- 当前专利权人: Megger Instruments Ltd
- 当前专利权人地址: GB Dover
- 代理机构: EIP US LLP
- 优先权: GB 01539 2020.02.05
- 主分类号: G01R27/18
- IPC分类号: G01R27/18 ; G01R19/10 ; G01R27/08
摘要:
Loop resistance is measured in a live-earth conductor loop comprising a residual current device powered by an alternating current mains supply. A measurement circuit having a low-pass filter characteristic arranged to substantially remove signal components at the frequency of the alternating current mains supply is used to measure, in a first period, a voltage across live and earth conductors of the live-earth conductor loop to determine a first voltage. A current application circuit is used to apply a unipolar test current having a magnitude below a trip current value of the residual current device for a second period and the measurement circuit is used to measure a second voltage between the live and earth conductors. Based on a difference in test current between the first and second periods and a difference in voltage between the first voltage and the second voltage, the resistance of the live-earth conductor loop is calculated.
公开/授权文献
- US20220357380A1 MEASURING LOOP RESISTANCE 公开/授权日:2022-11-10
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