Invention Grant
- Patent Title: Methods for frequency offset tracking in NR mmwave for efficient beam management
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Application No.: US17420217Application Date: 2020-02-12
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Publication No.: US12021661B2Publication Date: 2024-06-25
- Inventor: Ashok Kumar Reddy Chavva , Sripada Kadambar
- Applicant: Samsung Electronics Co., Ltd.
- Applicant Address: KR Suwon-si
- Assignee: Samsung Electronics Co., Ltd.
- Current Assignee: Samsung Electronics Co., Ltd.
- Current Assignee Address: KR Suwon-si
- Agency: Jefferson IP Law, LLP
- Priority: IN 1941005531 2019.02.12 IN 1941005531 2019.10.03
- International Application: PCT/KR2020/001954 2020.02.12
- International Announcement: WO2020/166958A 2020.08.20
- Date entered country: 2021-07-01
- Main IPC: H04L25/02
- IPC: H04L25/02 ; H04B7/0408 ; H04L5/00 ; H04W72/04 ; H04W72/044 ; H04W74/00 ; H04W74/08 ; H04W74/0833

Abstract:
Methods and systems for tracking frequency offset in NR are provided. A user equipment (UE) can compute the frequency offset comprising of crystal frequency drift and Doppler shift. Drift in frequencies generated by crystal oscillators in the UE and a base station are detected and nullified. Doppler shift of a serving beam is estimated using either data collected by sensors in the UE or reference signals received from the base station. Values of Doppler shift for a plurality of beams are estimated using the Doppler shift of the serving beam and sensor data, wherein the serving beam and the plurality of beams correspond to a same transmitter beam or different transmitter beams, wherein the type of QCL of the beams is either A, B, or C.
Public/Granted literature
- US20220070026A1 METHODS FOR FREQUENCY OFFSET TRACKING IN NR MMWAVE FOR EFFICIENT BEAM MANAGEMENT Public/Granted day:2022-03-03
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