- 专利标题: Object specific measuring with an opto-electronic measuring device
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申请号: US17113168申请日: 2020-12-07
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公开(公告)号: US12025736B2公开(公告)日: 2024-07-02
- 发明人: Thomas Piok , Jürg Hinderling
- 申请人: HEXAGON TECHNOLOGY CENTER GMBH
- 申请人地址: CH Heerbrugg
- 专利权人: HEXAGON TECHNOLOGY CENTER GMBH
- 当前专利权人: HEXAGON TECHNOLOGY CENTER GMBH
- 当前专利权人地址: CH Heerbrugg
- 代理机构: Maschoff Brennan
- 优先权: EP 216635 2019.12.16
- 主分类号: G01C3/08
- IPC分类号: G01C3/08 ; G01S7/48 ; G01S7/481 ; G01S17/10 ; G01S17/89
摘要:
A method for controlling an opto-electronic measuring device for radiation based object point measuring such as a laser tracker, laser scanner, multi beam scanner, laser profiler, scanning total station, flash lidar, airborne scanning lidar or scanning multi station. The power of the emitted measurement radiation is object individually automatically varied specific for a direction and distance to respective objects whereby the power is adjusted in such a way that it does not exceed a predefined distance dependent power limit applying to the respective object distance precisely when the measurement radiation is emitted in the respective object direction.
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