- 专利标题: Method of manufacturing semiconductor structure and semiconductor structure
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申请号: US17453046申请日: 2021-11-01
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公开(公告)号: US12029026B2公开(公告)日: 2024-07-02
- 发明人: Xiaoling Wang , Hai-Han Hung
- 申请人: CHANGXIN MEMORY TECHNOLOGIES, INC.
- 申请人地址: CN Hefei
- 专利权人: CHANGXIN MEMORY TECHNOLOGIES, INC.
- 当前专利权人: CHANGXIN MEMORY TECHNOLOGIES, INC.
- 当前专利权人地址: CN Hefei
- 代理机构: Kilpatrick Townsend & Stockton LLP
- 优先权: CN 2110926432.5 2021.08.12
- 主分类号: H01L27/108
- IPC分类号: H01L27/108 ; H01L29/78 ; H01L29/786 ; H10B12/00
摘要:
The present disclosure provides a method of manufacturing a semiconductor structure and a semiconductor structure, relating to the technical field of semiconductors. The method of manufacturing a semiconductor structure includes: providing a substrate; forming active pillars arranged in an array on the substrate, a projection shape of a longitudinal section of each of the active pillars includes a cross shape; forming a first oxide layer on the substrate, where a filling region is formed between adjacent active pillars in the same row; sequentially forming a word line and a dielectric layer in the filling region; exposing a top surface of each of the active pillars; forming a contact layer on the active pillars; and forming a capacitor structure on the contact layer.
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