- 专利标题: Predictive process control for a manufacturing process
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申请号: US18357560申请日: 2023-07-24
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公开(公告)号: US12032365B2公开(公告)日: 2024-07-09
- 发明人: Matthew C. Putman , John B. Putman , Vadim Pinskiy , Damas Limoge
- 申请人: Nanotronics Imaging, Inc.
- 申请人地址: US OH Cuyahoga Falls
- 专利权人: Nanotronics Imaging, Inc.
- 当前专利权人: Nanotronics Imaging, Inc.
- 当前专利权人地址: US OH Cuyahoga Falls
- 代理机构: DLA PIPER LLP (US)
- 主分类号: G05B13/02
- IPC分类号: G05B13/02 ; G05B19/418
摘要:
Aspects of the disclosed technology encompass the use of a deep-learning controller for monitoring and improving a manufacturing process. In some aspects, a method of the disclosed technology includes steps for: receiving control values associated with a process station in a manufacturing process, predicting an expected value for an article of manufacture output from the process station, and determining if the deep-learning controller can control the manufacturing process based on the expected value. Systems and computer-readable media are also provided.
公开/授权文献
- US12117814B2 Predictive process control for a manufacturing process 公开/授权日:2024-10-15
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