Invention Grant
- Patent Title: Method of testing a suspend operation
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Application No.: US17875569Application Date: 2022-07-28
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Publication No.: US12039186B2Publication Date: 2024-07-16
- Inventor: Suyong Kim , Junyong Park , Sangbum Yun , Ilhan Park
- Applicant: SAMSUNG ELECTRONICS CO., LTD.
- Applicant Address: KR Suwon-si
- Assignee: SAMSUNG ELECTRONICS CO., LTD.
- Current Assignee: SAMSUNG ELECTRONICS CO., LTD.
- Current Assignee Address: KR Suwon-si
- Agency: F. CHAU & ASSOCIATES, LLC
- Priority: KR 20210154730 2021.11.11
- Main IPC: G06F3/06
- IPC: G06F3/06

Abstract:
A method of testing a suspend operation, the method including: determining whether to transfer a suspend sampling signal to a suspend command circuit at a time point prior to each of a plurality of suspend operation time points stored in a sequence operation circuit; transferring the suspend sampling signal from the sequence operation circuit to the suspend command circuit; generating an internal suspend operation command based on the suspend sampling signal; transferring the internal suspend operation command from the suspend command circuit to the sequence operation circuit; performing suspend operations for all the plurality of suspend operation time points in response to the internal suspend operation command; and determining whether the suspend operations are performed at all of the suspend operation time points.
Public/Granted literature
- US20230143341A1 METHOD OF TESTING A SUSPEND OPERATION Public/Granted day:2023-05-11
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