Invention Grant
- Patent Title: Two-sided page scans with calibration feedback
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Application No.: US17675392Application Date: 2022-02-18
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Publication No.: US12040025B2Publication Date: 2024-07-16
- Inventor: Christopher M. Smitchger , Vamsi Pavan Rayaprolu , Patrick R. Khayat , Hyung Seok Kim , Steven Michael Kientz
- Applicant: Micron Technology, Inc.
- Applicant Address: US ID Boise
- Assignee: Micron Technology, Inc.
- Current Assignee: Micron Technology, Inc.
- Current Assignee Address: US ID Boise
- Agency: Lowenstein Sandler LLP
- Main IPC: G11C11/34
- IPC: G11C11/34 ; G06F11/07 ; G11C16/14 ; G11C16/26 ; G11C16/04

Abstract:
A system includes a memory device including an block and a processing device, operatively coupled with the memory device, to perform operations including initiating a page scan with respect to a page of the block, determining whether to perform an erased page check, and in response to determining that the erased page check is not to be performed, performing a two-sided page scan with calibration feedback.
Public/Granted literature
- US20230268009A1 TWO-SIDED PAGE SCANS WITH CALIBRATION FEEDBACK Public/Granted day:2023-08-24
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