Invention Grant
- Patent Title: Method of forming a nano-FET semiconductor device
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Application No.: US17322405Application Date: 2021-05-17
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Publication No.: US12040382B2Publication Date: 2024-07-16
- Inventor: Li-Chi Yu , Cheng-I Chu , Chen-Fong Tsai , Yi-Rui Chen , Sen-Hong Syue , Wen-Kai Lin , Yoh-Rong Liu , Huicheng Chang , Yee-Chia Yeo
- Applicant: Taiwan Semiconductor Manufacturing Co., Ltd.
- Applicant Address: TW Hsinchu
- Assignee: TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD.
- Current Assignee: TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD.
- Current Assignee Address: TW Hsinchu
- Agency: Slater Matsil, LLP
- Main IPC: H01L29/66
- IPC: H01L29/66 ; H01L21/02 ; H01L21/285 ; H01L21/306 ; H01L21/8238 ; H01L27/092 ; H01L29/06 ; H01L29/417 ; H01L29/423 ; H01L29/45 ; H01L29/786

Abstract:
Embodiments include nanostructure devices and methods of forming nanostructure devices which include a treatment process to expand a sidewall spacer material to close a seam in the sidewall spacer material after deposition. The treatment process includes oxidation anneal and heat anneal to expand the sidewall spacer material and crosslink the open seam to form a closed seam, lower k-value, and decrease density.
Public/Granted literature
- US20220262925A1 Nano-Fet Semiconductor Device and Method of Forming Public/Granted day:2022-08-18
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