Invention Grant
- Patent Title: Method and apparatus for collecting bit error information
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Application No.: US18332438Application Date: 2023-06-09
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Publication No.: US12040970B2Publication Date: 2024-07-16
- Inventor: Yali Wang , Fan Yang , Tianran Zhou
- Applicant: HUAWEI TECHNOLOGIES CO., LTD.
- Applicant Address: CN Shenzhen
- Assignee: HUAWEI TECHNOLOGIES CO., LTD.
- Current Assignee: HUAWEI TECHNOLOGIES CO., LTD.
- Current Assignee Address: CN Shenzhen
- Agent Jinghua Karen Tang
- Priority: CN 2011463838.6 2020.12.11 CN 2110098933.9 2021.01.25
- Main IPC: H04L45/28
- IPC: H04L45/28 ; H04L45/00 ; H04L45/42

Abstract:
A method for collecting bit error information is provided. According to the method, a head node may encapsulate indication information into an IPv6 extension header of an IPv6 measurement request packet. The indication information indicates at least one intermediate node on a transmission path of the IPv6 measurement request packet to record bit error information into the IPv6 extension header. According to the application, the bit error information of the intermediate node on the transmission path can be collected.
Public/Granted literature
- US12003413B2 Method and apparatus for collecting bit error information Public/Granted day:2024-06-04
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