Invention Grant
- Patent Title: Test method, test apparatus and display device
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Application No.: US17882663Application Date: 2022-08-08
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Publication No.: US12051346B2Publication Date: 2024-07-30
- Inventor: Hyungwoo Yim , Seyun Kim , Huisu Kim , Hakmo Choi , Seungho Park , Kyung-Sik Joo
- Applicant: Samsung Display Co., Ltd.
- Applicant Address: KR Yongin-Si
- Assignee: Samsung Display Co., Ltd.
- Current Assignee: Samsung Display Co., Ltd.
- Current Assignee Address: KR Yongin-si
- Agency: Innovation Counsel LLP
- Priority: KR 20220016949 2022.02.09
- Main IPC: G09G3/00
- IPC: G09G3/00 ; G09G3/20

Abstract:
A test method includes generating first image data by imaging a display panel including pixels, generating boundary data by detecting a spot area in the display panel based on the first image data, generating second image data by deblurring the first image data with respect to a boundary area disposed at a boundary of the spot area based on the boundary data and generating correction data by setting a correction area including the boundary area based on the second image data.
Public/Granted literature
- US20230252921A1 TEST METHOD, TEST APPARATUS AND DISPLAY DEVICE Public/Granted day:2023-08-10
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