Invention Grant
- Patent Title: Apparatus and method for cleaning an inspection system
-
Application No.: US17563867Application Date: 2021-12-28
-
Publication No.: US12055478B2Publication Date: 2024-08-06
- Inventor: Andrey Nikipelov , Saeedeh Farokhipoor , Maarten Van Kampen
- Applicant: ASML NETHERLANDS B.V.
- Applicant Address: NL Veldhoven
- Assignee: ASML NETHERLANDS B.V.
- Current Assignee: ASML NETHERLANDS B.V.
- Current Assignee Address: NL Veldhoven
- Agency: Pillsbury Winthrop Shaw Pittman, LLP
- Main IPC: G01N21/15
- IPC: G01N21/15 ; G01N21/88 ; G01N21/95 ; G02B1/18 ; G02B5/08

Abstract:
A method and apparatus for cleaning vacuum ultraviolet (VUV) optics (e.g., one or more mirrors of a VUV) of a substrate inspection system is disclosed. The cleaning system ionizes or disassociates hydrogen gas in a VUV optics environment to generate hydrogen radicals (e.g., H*) or ions (e.g., H+, H2+, H3+, which remove water or hydrocarbons from the surface of the one or more mirrors. The one or more VUV mirrors may include a reflective material, such as aluminum. The one or more VUV mirrors may have a protective coating to protect the reflective material from any detrimental reaction to the hydrogen radicals or ions. The protective coating may include a noble metal.
Public/Granted literature
- US20220205900A1 APPARATUS AND METHOD FOR CLEANING AN INSPECTION SYSTEM Public/Granted day:2022-06-30
Information query