Invention Grant
- Patent Title: Extreme ultraviolet lithography method using robust, high transmission pellicle
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Application No.: US18301701Application Date: 2023-04-17
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Publication No.: US12055855B2Publication Date: 2024-08-06
- Inventor: Yun-Yue Lin
- Applicant: TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD.
- Applicant Address: TW Hsinchu
- Assignee: TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD.
- Current Assignee: TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD.
- Current Assignee Address: TW Hsinchu
- Agency: Maschoff Brennan
- The original application number of the division: US16885126 2020.05.27
- Main IPC: G03F7/20
- IPC: G03F7/20 ; G03F1/62 ; G03F1/64 ; G03F7/00

Abstract:
A robust, high-transmission pellicle for extreme ultraviolet lithography systems is disclosed. In one example, the present disclosure provides a pellicle that includes a membrane and a frame supporting the membrane. The membrane may be formed from at least one of a transparent carbon-based film and a transparent silicon based film. The at least one of the transparent carbon-based film and the transparent silicon based film may further be coated with a protective shell. The frame may include at least one aperture to allow for a flow of air through a portion of the pellicle.
Public/Granted literature
- US20230251566A1 EXTREME ULTRAVIOLET LITHOGRAPHY METHOD USING ROBUST, HIGH TRANSMISSION PELLICLE Public/Granted day:2023-08-10
Information query
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