发明授权
- 专利标题: Resolution measurement apparatus and resolution measurement method using the same
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申请号: US17367785申请日: 2021-07-06
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公开(公告)号: US12072259B2公开(公告)日: 2024-08-27
- 发明人: Sanghui Park , Jinwook Lee
- 申请人: SAMSUNG DISPLAY CO., LTD.
- 申请人地址: KR Yongin-si
- 专利权人: SAMSUNG DISPLAY CO., LTD.
- 当前专利权人: SAMSUNG DISPLAY CO., LTD.
- 当前专利权人地址: KR Yongin-si
- 代理机构: F. Chau & Associates, LLC
- 优先权: KR 20200111939 2020.09.02
- 主分类号: G01M11/02
- IPC分类号: G01M11/02 ; G02B7/02 ; G01N21/17
摘要:
A resolution measurement apparatus includes a stage configured to receive a display module including an optical part. The stage includes an opening that overlaps the optical part, when viewed in a plan view, when the display module is disposed on the stage. The resolution measuring apparatus further includes a plurality of cameras disposed above the stage, a light source disposed under the stage and overlapping the opening when viewed in the plan view, and a lens disposed between the light source and the stage. The lens overlaps the opening when viewed in the plan view, and the optical part overlaps the lens, when viewed in the plan view, when the display module is disposed on the stage.
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