- 专利标题: Method for producing an advanced substrate for hybrid integration
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申请号: US18047113申请日: 2022-10-17
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公开(公告)号: US12074056B2公开(公告)日: 2024-08-27
- 发明人: Walter Schwarzenbach
- 申请人: Soitec
- 申请人地址: FR Bernin
- 专利权人: Soitec
- 当前专利权人: Soitec
- 当前专利权人地址: FR Bernin
- 代理机构: TraskBritt
- 优先权: FR 00972 2018.09.14
- 分案原申请号: US17276107
- 主分类号: H01L21/762
- IPC分类号: H01L21/762 ; H01L21/84 ; H01L27/12 ; H01L21/02
摘要:
A method of forming a substrate comprises providing a receiver substrate and a donor substrate successively comprising: a carrier substrate, a sacrificial layer, which can be selectively etched in relation to an active layer, and a silicon oxide layer, which is arranged on the active layer. A cavity is formed in the oxide layer to form a first portion that has a first thickness and a second portion that has a second thickness greater than the first thickness. The cavity is filled with a polycrystalline silicon filling layer to form a second free surface that is continuous and substantially planar. The receiver substrate and the donor substrate are assembled at the second free surface, and the carrier substrate is eliminated while preserving the active layer and the sacrificial layer.
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