Invention Grant
- Patent Title: Protection circuit in electronic device and method therefor
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Application No.: US17263044Application Date: 2020-10-30
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Publication No.: US12074572B2Publication Date: 2024-08-27
- Inventor: Hyunseok Choi , Jooseung Kim , Jihoon Kim , Hyoseok Na , Sanghun Sim , Namjun Cho
- Applicant: Samsung Electronics Co., Ltd.
- Applicant Address: KR Gyeonggi-do
- Assignee: Samsung Electronics Co., Ltd
- Current Assignee: Samsung Electronics Co., Ltd
- Current Assignee Address: KR
- Agency: The Farrell Law Firm, P.C.
- Priority: KR 20190136596 2019.10.30
- International Application: PCT/KR2020/015021 2020.10.30
- International Announcement: WO2021/086105A 2021.05.06
- Date entered country: 2021-01-25
- Main IPC: H03F1/52
- IPC: H03F1/52 ; H02H3/087 ; H03F3/24

Abstract:
An electronic device and method thereof of are provided to prevent burnout due to overcurrent. An electronic device includes a power amplifier configured to amplify a transmission signal; a battery configured to provide a bias voltage to the at least one power amplifier; and an overcurrent protection circuit configured to prevent overcurrent from flowing through the power amplifier. The overcurrent protection circuit includes a configurer configured to configure a reference current value, based on the power amplifier; a measurer configured to measure a bias current value due to the bias voltage; a comparator configured to compare the measured bias current value with the reference current value; and a controller configured to recognize overcurrent flowing through the power amplifier and control provision of the bias voltage, based on a result of the comparison.
Public/Granted literature
- US20220337200A1 PROTECTION CIRCUIT IN ELECTRONIC DEVICE AND METHOD THEREFOR Public/Granted day:2022-10-20
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