Invention Grant
- Patent Title: Calibration method, calibration apparatus, and program
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Application No.: US17036820Application Date: 2020-09-29
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Publication No.: US12078675B2Publication Date: 2024-09-03
- Inventor: Tsuyoshi Yamamoto , Yoshihito Hashimoto
- Applicant: NEC CORPORATION
- Applicant Address: JP Tokyo
- Assignee: NEC CORPORATION
- Current Assignee: NEC CORPORATION
- Current Assignee Address: JP Tokyo
- Agency: Sughrue Mion, PLLC
- Priority: JP 19191538 2019.10.18
- Main IPC: G01R31/317
- IPC: G01R31/317 ; G06N10/20 ; G06N10/40 ; H03J3/12 ; H10N60/00

Abstract:
A calibration method, a calibration apparatus, and a program capable of estimating a degree of signal loss of an input signal supplied to an oscillator are provided. The calibration method includes: outputting an input signal to be input to an oscillator to be calibrated that includes a resonator and performs parametric oscillation, from a signal generator connected to the resonator via a transmission path while sweeping a frequency or a power of this input signal; acquiring distribution data of an intensity of a reflection signal based on measurement of the intensity of the reflection signal from the oscillator in response to the input signal; and estimating a degree of signal loss by comparing the distribution data acquired by the measurement with the distribution data theoretically obtained in which a value of the degree of the signal loss of the transmission path is assumed.
Public/Granted literature
- US20210116499A1 CALIBRATION METHOD, CALIBRATION APPARATUS, AND PROGRAM Public/Granted day:2021-04-22
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