- 专利标题: Apparatus for preventing backside peeling defects on semiconductor wafers
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申请号: US16994400申请日: 2020-08-14
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公开(公告)号: US12080587B2公开(公告)日: 2024-09-03
- 发明人: Yen-Yu Chen , Wei-Jen Chen , Yi-Chen Chiang , Tsang-Yang Liu , Chang-Sheng Lee , Wei-Chen Liao , Wei Zhang
- 申请人: TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD.
- 申请人地址: TW Hsinchu
- 专利权人: TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD.
- 当前专利权人: TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD.
- 当前专利权人地址: TW Hsinchu
- 代理机构: Maschoff Brennan
- 分案原申请号: US13929297 2013.06.27
- 主分类号: H01L21/687
- IPC分类号: H01L21/687
摘要:
An apparatus includes a susceptor and a non-reactive gas source. The susceptor has through holes and a wafer support surface. Each through hole includes a lift pin and a lift pin head. The lift pin has a vertical degree of motion in the through hole to lift up or place a wafer on the susceptor. The lift pin head has at least one flow channel structure running from its first surface at least partially exposed to a bottom side of the susceptor through its second surface exposed to a top side of the susceptor wherein the lift pin. The non-reactive gas source is configured to flow a gas to a backside of the wafer through the flow channel structure through the bottom side of the susceptor.
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