Invention Grant
- Patent Title: Method for preparing semiconductor device structure with silicide portion between conductive plugs
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Application No.: US17520991Application Date: 2021-11-08
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Publication No.: US12080598B2Publication Date: 2024-09-03
- Inventor: Chun-Cheng Liao
- Applicant: NANYA TECHNOLOGY CORPORATION
- Applicant Address: TW New Taipei
- Assignee: NANYA TECHNOLOGY CORPORATION
- Current Assignee: NANYA TECHNOLOGY CORPORATION
- Current Assignee Address: TW New Taipei
- Agent Xuan Zhang
- Main IPC: H01L21/768
- IPC: H01L21/768 ; H01L23/522

Abstract:
A method for preparing a semiconductor device structure includes forming a first dielectric layer over a semiconductor substrate; forming a first conductive plug in the first dielectric layer; forming a polysilicon layer covering the first dielectric layer and the first conductive plug; transforming a portion of the polysilicon layer into a silicide portion; forming a second conductive plug directly over the silicide portion; and forming a second dielectric layer surrounding the second conductive plug.
Public/Granted literature
- US20230141895A1 METHOD FOR PREPARING SEMICONDUCTOR DEVICE STRUCTURE WITH SILICIDE PORTION BETWEEN CONDUCTIVE PLUGS Public/Granted day:2023-05-11
Information query
IPC分类: