Invention Grant
- Patent Title: Systems and methods for detecting a location of the optical elements causing multipath interference in an optical link
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Application No.: US17963341Application Date: 2022-10-11
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Publication No.: US12088337B2Publication Date: 2024-09-10
- Inventor: Zhiping Jiang
- Applicant: HUAWEI TECHNOLOGIES CO., LTD.
- Applicant Address: CN Guangdong
- Assignee: HUAWEI TECHNOLOGIES CO., LTD.
- Current Assignee: HUAWEI TECHNOLOGIES CO., LTD.
- Current Assignee Address: CN Shenzhen
- Agency: BCF LLP
- Main IPC: H04B10/075
- IPC: H04B10/075 ; H04B10/60 ; H04B10/61 ; H04B10/67 ; H04B10/40 ; H04B10/50

Abstract:
The disclosed systems and methods for detecting a location of reflection in an optical link comprising: i) receiving an optical signal; ii) receiving a plurality of first type of delayed optical signals corresponding to the optical signal; iii) determining a first type of time delays associated with each of the plurality of first type of delayed optical signals; iv) receiving a plurality of second type of delayed optical signals corresponding to the optical signal; v) determining a second type of time delays associated with the each of the plurality of second type of delayed optical signals; vi) computing relative delays from the second type of time delays; vii) comparing the relative delays with the first type of time delays; and viii) determining a location of a given optical element contributing to the reflections based on the given relative delay and the location of the AR.
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