- 专利标题: Systems and methods for detecting a location of the optical elements causing multipath interference in an optical link
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申请号: US17963341申请日: 2022-10-11
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公开(公告)号: US12088337B2公开(公告)日: 2024-09-10
- 发明人: Zhiping Jiang
- 申请人: HUAWEI TECHNOLOGIES CO., LTD.
- 申请人地址: CN Guangdong
- 专利权人: HUAWEI TECHNOLOGIES CO., LTD.
- 当前专利权人: HUAWEI TECHNOLOGIES CO., LTD.
- 当前专利权人地址: CN Shenzhen
- 代理机构: BCF LLP
- 主分类号: H04B10/075
- IPC分类号: H04B10/075 ; H04B10/60 ; H04B10/61 ; H04B10/67 ; H04B10/40 ; H04B10/50
摘要:
The disclosed systems and methods for detecting a location of reflection in an optical link comprising: i) receiving an optical signal; ii) receiving a plurality of first type of delayed optical signals corresponding to the optical signal; iii) determining a first type of time delays associated with each of the plurality of first type of delayed optical signals; iv) receiving a plurality of second type of delayed optical signals corresponding to the optical signal; v) determining a second type of time delays associated with the each of the plurality of second type of delayed optical signals; vi) computing relative delays from the second type of time delays; vii) comparing the relative delays with the first type of time delays; and viii) determining a location of a given optical element contributing to the reflections based on the given relative delay and the location of the AR.
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