Invention Grant
- Patent Title: Optical detection system calibration
-
Application No.: US17762456Application Date: 2021-05-24
-
Publication No.: US12092567B2Publication Date: 2024-09-17
- Inventor: Francesco Paolo D'Aleo , Javier Miguel Sánchez , Kotaro Ishizaki , Peter Roentgen
- Applicant: ams Sensors Singapore Pte. Ltd.
- Applicant Address: SG Singapore
- Assignee: AMS Sensors Singapore Pte. Ltd.
- Current Assignee: AMS Sensors Singapore Pte. Ltd.
- Current Assignee Address: SG Singapore
- Agency: Viering, Jentschura & Partner mbB
- Agent Samuel Y. Lo
- Priority: GB 09640 2020.06.24
- International Application: PCT/SG2021/050281 2021.05.24
- International Announcement: WO2021/262088A 2021.12.30
- Date entered country: 2022-03-22
- Main IPC: G01N21/27
- IPC: G01N21/27 ; G01N21/55

Abstract:
According to a first aspect of the present invention there is provided a method of measuring the optical reflectance R of a target using a detection system comprising a light emitter and a light detector spaced apart from one another. The method comprises illuminating the target with the light emitter, detecting light reflected from the target using the light detector, wherein the light detector provides an electrical output signal SS indicative of the intensity of the detected light, and determining the optical reflectance R of the target according to (Formula 1), where RR is the spectral reflectance of a reference standard, SR is the detector electrical output signal with the reference standard in place, SH is the detector electrical output signal with no target in front of the light emitter and light detector, and M is a calibration factor.
R
=
M
·
R
R
s
s
-
s
H
M
·
⌈
s
R
-
s
H
⌉
-
R
R
⌈
s
R
-
s
s
⌉
,
(
I
)
R
=
M
·
R
R
s
s
-
s
H
M
·
⌈
s
R
-
s
H
⌉
-
R
R
⌈
s
R
-
s
s
⌉
,
(
I
)
Public/Granted literature
- US20220373454A1 OPTICAL DETECTION SYSTEM CALIBRATION Public/Granted day:2022-11-24
Information query