Invention Grant
- Patent Title: Capacitance measurement circuit
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Application No.: US17964847Application Date: 2022-10-12
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Publication No.: US12092672B2Publication Date: 2024-09-17
- Inventor: Yi-Chou Huang
- Applicant: Elite Semiconductor Microelectronics Technology Inc.
- Applicant Address: TW Hsinchu
- Assignee: Elite Semiconductor Microelectronics Technology Inc.
- Current Assignee: Elite Semiconductor Microelectronics Technology Inc.
- Current Assignee Address: TW Hsinchu
- Agent Winston Hsu
- Main IPC: G01R27/26
- IPC: G01R27/26 ; H03F3/45 ; H03M3/00

Abstract:
A capacitance measure circuit includes a charge to voltage converter (CVC), and the CVC includes an excitation signal generation circuit that is arranged to generate and connect an excitation signal to a first terminal of a capacitance sensor, a differential amplifier, a first switch circuit, and at least one first variable capacitor. The inverting input terminal of the differential amplifier is arranged to receive a sensing capacitance value from a second terminal of the capacitance sensor. The first switch circuit is coupled between the inverting input terminal and the non-inverting output terminal of the differential amplifier, and is connected in parallel with the at least one first variable capacitor at the inverting input terminal and the non-inverting output terminal of the differential amplifier.
Public/Granted literature
- US20240133934A1 CAPACITANCE MEASUREMENT CIRCUIT Public/Granted day:2024-04-25
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