Invention Grant
- Patent Title: X-ray photon-counting data correction through deep learning
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Application No.: US17704520Application Date: 2022-03-25
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Publication No.: US12099152B2Publication Date: 2024-09-24
- Inventor: Ge Wang , Mengzhou Li , David S. Rundle
- Applicant: Ge Wang , Mengzhou Li , David S. Rundle
- Applicant Address: US NY Loudonville
- Assignee: Rensselaer Polytechnic Institute
- Current Assignee: Rensselaer Polytechnic Institute
- Current Assignee Address: US NY Troy
- Agency: Barclay Damon, LLC
- Agent Anthony P. Gangemi
- Main IPC: G01T1/17
- IPC: G01T1/17 ; G01T1/36 ; G06N3/04 ; G06N3/045 ; G06N3/047 ; G06N3/08 ; G06N3/088 ; G06N3/126

Abstract:
A method for x-ray photon-counting data correction. The method includes generating, by a training data generation module, training input spectral projection data based, at least in part, on a reference spectral projection data. The training input spectral projection data includes at least one of a pulse pileup distortion, a charge splitting distortion, and/or noise. The method further includes training, by a training module, a data correction artificial neural network (ANN) based, at least in part, on training data. The data correction ANN includes a pulse pileup correction ANN, and a charge splitting correction ANN. The training data includes the training input spectral projection data and the reference spectral projection data.
Public/Granted literature
- US20220308242A1 X-RAY PHOTON-COUNTING DATA CORRECTION THROUGH DEEP LEARNING Public/Granted day:2022-09-29
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