- 专利标题: Source code analysis apparatus and source code analysis method
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申请号: US17735267申请日: 2022-05-03
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公开(公告)号: US12099836B2公开(公告)日: 2024-09-24
- 发明人: Makoto Ichii , Masumi Kawakami
- 申请人: Hitachi, Ltd.
- 申请人地址: JP Tokyo
- 专利权人: Hitachi, Ltd.
- 当前专利权人: Hitachi, Ltd.
- 当前专利权人地址: JP Tokyo
- 代理机构: Crowell & Moring LLP
- 优先权: JP 21094819 2021.06.04
- 主分类号: G06F8/75
- IPC分类号: G06F8/75 ; G06F8/72 ; G06F8/77
摘要:
When any one or a combination of a ticket, a source code change history, and a source code is input, a source code analysis apparatus generates information of a factor pattern from the information, and a factor metrics calculation unit calculates factor metrics regarding the factor pattern as measured information regarding the factor pattern. In addition, the QCD measurement value is acquired from the information, the QCD index is calculated based on the QCD measurement value, and the correlation calculation unit calculates a correlation coefficient for a pair of the factor metrics and the QCD index, stores the correlation coefficient in the correlation list, calculates a score for the pair of the factor pattern and the QCD measurement value, and generates the important factor pattern information table in which the score is assigned to the pair of the factor pattern and the QCD measurement value.
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