Invention Grant
- Patent Title: Structure evaluation system, structure evaluation apparatus, and structure evaluation method
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Application No.: US17653291Application Date: 2022-03-03
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Publication No.: US12104986B2Publication Date: 2024-10-01
- Inventor: Takashi Usui , Hidefumi Takamine , Yuki Ueda , Keisuke Ueno , Yousuke Hisakuni , Kazuo Watabe
- Applicant: Kabushiki Kaisha Toshiba
- Applicant Address: JP Tokyo
- Assignee: Kabushiki Kaisha Toshiba
- Current Assignee: Kabushiki Kaisha Toshiba
- Current Assignee Address: JP Tokyo
- Agency: Oblon, McClelland, Maier & Neustadt, L.L.P.
- Priority: JP 21151057 2021.09.16
- Main IPC: G01M7/08
- IPC: G01M7/08

Abstract:
According to one embodiment, a structure evaluation system includes at least three or more sensors, a position locator, and an evaluator. The three or more sensors are arranged on surfaces different from a surface to which an impact is applied with respect to a structure at different intervals in a first direction of the structure and a second direction orthogonal to the first direction and detects elastic waves generated from the structure. The position locator locates a position of a source in which the elastic waves are generated on the basis of the elastic waves detected by each of the three or more sensors. The evaluator evaluates a deterioration state of the structure on the basis of information based on a position location process of the position locator and information indicating a position where the impact is applied.
Public/Granted literature
- US20230083554A1 STRUCTURE EVALUATION SYSTEM, STRUCTURE EVALUATION APPARATUS, AND STRUCTURE EVALUATION METHOD Public/Granted day:2023-03-16
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