- 专利标题: Configuration tool and method for a quality control system
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申请号: US18318249申请日: 2023-05-16
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公开(公告)号: US12118674B2公开(公告)日: 2024-10-15
- 发明人: Ives De Saeger
- 申请人: ARKITE NV
- 申请人地址: BE Genk
- 专利权人: ARKITE NV
- 当前专利权人: ARKITE NV
- 当前专利权人地址: BE Genk
- 代理机构: Workman Nydegger
- 优先权: EP 193384 2017.09.27
- 主分类号: G06T19/00
- IPC分类号: G06T19/00 ; G01F15/075 ; G06F3/01 ; G06T15/08
摘要:
A configuration tool adapted to configure a quality control system to monitor and/or guide an operator in a working environment through recognition of objects, events or an operational process, comprises: a volumetric sensor adapted to capture volumetric image frames of the working environment while an object, event or operational process is demonstrated; a display, coupled to the volumetric sensor and configured to live display the volumetric image frames; and a processor configured to: generate a user interface in overlay of the volumetric image frames to enable a user to define a layout zone; and automatically generate a virtual box in the layout zone when an object, event or operational process is detected during demonstration of the object, event or operational process.
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