Invention Grant
- Patent Title: Dynamic processing chamber baffle
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Application No.: US17498189Application Date: 2021-10-11
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Publication No.: US12119209B2Publication Date: 2024-10-15
- Inventor: Udit S. Kotagi , Mayur Govind Kulkarni
- Applicant: Applied Materials, Inc.
- Applicant Address: US CA Santa Clara
- Assignee: Applied Materials, Inc.
- Current Assignee: Applied Materials, Inc.
- Current Assignee Address: US CA Santa Clara
- Agency: Kilpatrick Townsend & Stockton LLP
- Main IPC: H01J37/32
- IPC: H01J37/32

Abstract:
Exemplary methods of semiconductor processing may include delivering a deposition precursor into a processing region of a semiconductor processing chamber. The methods may include depositing a layer of material on a substrate housed in the processing region of the semiconductor processing chamber. The processing region may be maintained at a first pressure during the deposition. The methods may include extending a baffle within the processing region. The baffle may modify a flow path within the processing region. The methods may include forming a plasma of a treatment or etch precursor within the processing region of the semiconductor processing chamber. The processing region may be maintained at a second pressure during the forming. The methods may include treating the layer of material deposited on the substrate with plasma effluents of the treatment precursor. The processes may be cycled any number of times.
Public/Granted literature
- US20230114104A1 DYNAMIC PROCESSING CHAMBER BAFFLE Public/Granted day:2023-04-13
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