- 专利标题: Semiconductor package and method of fabricating semiconductor package
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申请号: US18362968申请日: 2023-08-01
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公开(公告)号: US12125741B2公开(公告)日: 2024-10-22
- 发明人: Zi-Jheng Liu , Chen-Cheng Kuo , Hung-Jui Kuo
- 申请人: Taiwan Semiconductor Manufacturing Company, Ltd.
- 申请人地址: TW Hsinchu
- 专利权人: Taiwan Semiconductor Manufacturing Company, Ltd.
- 当前专利权人: Taiwan Semiconductor Manufacturing Company, Ltd.
- 当前专利权人地址: TW Hsinchu
- 代理机构: JCIPRNET
- 分案原申请号: US17185978 2021.02.26
- 主分类号: H01L23/053
- IPC分类号: H01L23/053 ; H01L21/02 ; H01L21/56 ; H01L21/768 ; H01L21/78 ; H01L23/31 ; H01L23/532 ; H01L23/538 ; H01L23/00
摘要:
A method of fabricating a semiconductor package includes providing a substrate having at least one contact and forming a redistribution layer on the substrate. The formation of the redistribution layer includes forming a dielectric material layer over the substrate and performing a double exposure process to the dielectric material layer. A development process is then performed and a dual damascene opening is formed in the dielectric material layer. A seed metallic layer is formed over the dual damascene opening and over the dielectric material layer. A metal layer is formed over the seed metallic layer. A redistribution pattern is formed in the first dual damascene opening and is electrically connected with the at least one contact.
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