Invention Grant
- Patent Title: Measurement system, measurement method and non-transitory storage medium
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Application No.: US17893791Application Date: 2022-08-23
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Publication No.: US12151385B2Publication Date: 2024-11-26
- Inventor: Naoki Mitsutani
- Applicant: MITUTOYO CORPORATION
- Applicant Address: JP Kanagawa
- Assignee: MITUTOYO CORPORATION
- Current Assignee: MITUTOYO CORPORATION
- Current Assignee Address: JP Kanagawa
- Agency: Greenblum & Bernstein, P.L.C.
- Priority: JP2021-143284 20210902
- Main IPC: B25J9/16
- IPC: B25J9/16 ; B25J19/02 ; G06T7/60 ; G06T7/73

Abstract:
A measurement system includes a multi-axis robot, a measurement unit coupled to the multi-axis robot, and a data processing apparatus, wherein the measurement unit includes one or more imaging devices movable with respect to a reference position of the multi-axis robot, and a position specification device for specifying a position of one or more of the imaging devices with respect to the reference position, wherein the data processing apparatus includes an acquisition part for acquiring a plurality of pieces of captured image data generated by having one or more of the imaging devices capture images at two or more positions, and a measurement part for measuring a distance between the plurality of feature points in a workpiece on the basis of a position of the feature point of the workpiece included in the plurality of pieces of captured image data.
Public/Granted literature
- US20230062780A1 MEASUREMENT SYSTEM, MEASUREMENT METHOD AND NON-TRANSITORY STORAGE MEDIUM Public/Granted day:2023-03-02
Information query
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