Invention Grant
- Patent Title: Surface abnormality detection device and system
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Application No.: US17599757Application Date: 2020-03-17
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Publication No.: US12154258B2Publication Date: 2024-11-26
- Inventor: Yoshimasa Ono , Akira Tsuji , Hidemi Noguchi , Junichi Abe
- Applicant: NEC Corporation
- Applicant Address: JP Tokyo
- Assignee: NEC Corporation
- Current Assignee: NEC Corporation
- Current Assignee Address: JP Tokyo
- Priority: WOPCT/JP2019/014790 20190403
- International Application: PCT/JP2020/011759 WO 20200317
- International Announcement: WO2020/203263 WO 20201008
- Main IPC: G06T7/00
- IPC: G06T7/00 ; G01B11/30 ; G01C3/06 ; G01N21/956 ; G01S17/06 ; G01S17/89 ; G06T7/70 ; G06V10/764

Abstract:
There is provided a surface abnormality detection device, and a system, capable of detecting an abnormal portion having a displacement below the distance measurement accuracy when detecting the abnormal portion on the surface of a structure. A surface abnormality detection device includes a classification means for classifying an object under measurement into one or more clusters having the same structure, based on position information at a plurality of points on a surface of the object under measurement; a determination means for determining a reflection brightness normal value of the cluster based on a distribution of reflection brightness values at a plurality of points on a surface of the cluster; and an identification means for identifying an abnormal portion on the surface of the cluster based on a difference between the reflection brightness normal value and the reflection brightness value at each of the plurality of points.
Public/Granted literature
- US20220156914A1 SURFACE ABNORMALITY DETECTION DEVICE AND SYSTEM Public/Granted day:2022-05-19
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