A method for determining a scan pattern according to which a sensor equipped with a scanner scans a field of regard (FOR) is presented. The method comprises obtaining, by processing hardware, a plurality of objective functions, each of the objective functions specifying a cost for a respective property of the scan pattern, expressed in terms of one or more operational parameters of the scanner. The method further includes applying, by the processing hardware, an optimization scheme to the plurality of objective functions to generate the scan pattern. The method further includes scanning the FOR according to the generated scan pattern.