Invention Grant
- Patent Title: Method of obtaining and imputing missing data and measurement system using the same
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Application No.: US18149991Application Date: 2023-01-04
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Publication No.: US12158869B2Publication Date: 2024-12-03
- Inventor: Seongwook Yoon , Sanghoon Sull , Jaehyun Kim , Heejeong Lim
- Applicant: SAMSUNG ELECTRONICS CO., LTD.
- Applicant Address: KR Suwon-si
- Assignee: SAMSUNG ELECTRONICS CO., LTD.
- Current Assignee: SAMSUNG ELECTRONICS CO., LTD.
- Current Assignee Address: KR Suwon-si
- Agency: F. CHAU & ASSOCIATES, LLC
- Priority: KR10-2022-0001431 20220105
- Main IPC: G06F16/215
- IPC: G06F16/215 ; G06F16/2458

Abstract:
A method of obtaining and imputing missing data and a measurement system having the same are disclosed. The method includes obtaining measurement values of measurement variables, among z variables corresponding to z components of a measurement object, wherein z is a natural number greater than 1, and the z variables of the measurement object include measurement variables and missing variables which are not measured, and the measurement variables are of an amount less than z; generating missing data having the measurement variables with the measurement values and the missing variables with missing values in the z components, wherein each of the missing values is predetermined value indicating that a missing variable has not been measured; generating k pieces of final imputation data having k final imputation values, by using the missing data, wherein k is a natural number greater than 1, each of the k final imputation values are in the z components, and using the missing data includes performing multiple imputations on the missing data; and generating average data having average component values in the z components, wherein each of the average component values in a component is an average value of the k final imputation values of the k pieces of final imputation data in the component, and selecting, in each of the z components, a next measurement variable, wherein a difference value between a final imputation values and an average component value, of the next measurement variable, is larger than a difference value of the missing variables.
Public/Granted literature
- US20230214371A1 METHOD OF OBTAINING AND IMPUTING MISSING DATA AND MEASUREMENT SYSTEM USING THE SAME Public/Granted day:2023-07-06
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